X-ray bright-field imaging analyzes crystalline quality and defects of SiC wafers
نویسندگان
چکیده
منابع مشابه
X-ray Dark Field Imaging
A new kind of enhanced contrast X-ray imaging of weakly absorbing materials in dark field mode is presented. Samples such as plastics and biological tissue are a perpetual challenge for radiographic imaging. Recent innovative approaches such as Diffraction Enhanced Imaging (DEI), “phase contrast”, grating interferometry (Talbot-Lau), or Refraction Enhanced Imaging (REI) have in common that they...
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We present Kepler light curves and optical spectroscopy of twenty X-ray bright stars located in the Kepler field of view. The stars, spectral type F-K, show evidence for rapid rotation including chromospheric activity 100 times or more above the Sun at maximum and flaring behavior in their light curves. Eighteen of our objects appear to be (sub)giants and may belong to the class of FK Com varia...
متن کاملX-ray dark-field imaging modeling.
Dark-field images are formed from x-ray small-angle scattering signals. The small-angle scattering signals are particularly sensitive to structural variation and density fluctuation on a length scale of several tens to hundreds of nanometers, offering a unique contrast mechanism to reveal subtle structural features of an object. In this study, based on the principle of energy conservation, we d...
متن کاملDark-field hyperspectral X-ray imaging.
In recent times, there has been a drive to develop non-destructive X-ray imaging techniques that provide chemical or physical insight. To date, these methods have generally been limited; either requiring raster scanning of pencil beams, using narrow bandwidth radiation and/or limited to small samples. We have developed a novel full-field radiographic imaging technique that enables the entire ph...
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ژورنال
عنوان ژورنال: Journal of Applied Crystallography
سال: 2007
ISSN: 0021-8898
DOI: 10.1107/s0021889806055683